Примерен код |
TU-160:~# smartctl -a /dev/hde smartctl version 5.37 [i686-pc-linux-gnu] Copyright © 2002-6 Bruce Allen Home page is [URL=http://smartmontools.sourceforge.net/]http://smartmontools.sourceforge.net/[/URL] === START OF INFORMATION SECTION === Model Family: SAMSUNG SpinPoint P80 series Device Model: SAMSUNG SP1654N Serial Number: S0GEJ1JL401057 Firmware Version: BV100-37 User Capacity: 160,041,885,696 bytes Device is: In smartctl database [for details use: -P show] ATA Version is: 7 ATA Standard is: ATA/ATAPI-7 T13 1532D revision 4a Local Time is: Sun Feb 3 09:20:36 2008 EET SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x00) Offline data collection activity was never started. Auto Offline Data Collection: Disabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (3699) seconds. Offline data collection capabilities: (0x5B) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 61) minutes. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 100 099 051 Pre-fail Always - 0 3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 6144 4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 137 5 Reallocated_Sector_Ct 0x0033 099 099 010 Pre-fail Always - 10 7 Seek_Error_Rate 0x000f 253 253 051 Pre-fail Always - 0 8 Seek_Time_Performance 0x0025 253 253 015 Pre-fail Offline - 0 9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 104h+42m 10 Spin_Retry_Count 0x0033 253 253 051 Pre-fail Always - 0 11 Calibration_Retry_Count 0x0012 253 253 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 130 187 Unknown_Attribute 0x0032 059 059 000 Old_age Always - 42 190 Temperature_Celsius 0x0022 088 052 045 Old_age Always - 50 194 Temperature_Celsius 0x0022 088 052 000 Old_age Always - 50 195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 1463610 196 Reallocated_Event_Count 0x0032 099 099 000 Old_age Always - 10 197 Current_Pending_Sector 0x0012 253 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0030 253 253 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 199 000 Old_age Always - 3547 200 Multi_Zone_Error_Rate 0x000a 100 100 000 Old_age Always - 0 201 Soft_Read_Error_Rate 0x000a 253 100 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 3502 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 3502 occurred at disk power-on lifetime: 11605 hours (483 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 80 e7 33 7b e1 Error: ICRC, ABRT at LBA = 0x017b33e7 = 24851431 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 03 80 e7 33 7b e1 00 00:28:08.625 WRITE DMA c8 03 01 00 00 00 e0 00 00:28:08.250 READ DMA c8 03 01 00 00 00 e0 00 00:28:08.188 READ DMA c8 03 01 00 00 00 e0 00 00:28:07.938 READ DMA c8 03 01 00 00 00 e0 00 00:28:07.750 READ DMA Error 3501 occurred at disk power-on lifetime: 11605 hours (483 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 80 e7 33 7b e1 Error: ICRC, ABRT at LBA = 0x017b33e7 = 24851431 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 03 80 e7 33 7b e1 00 00:28:07.625 WRITE DMA ca 03 08 57 c4 50 e9 00 00:28:07.438 WRITE DMA ca 03 18 9f e9 51 e9 00 00:28:07.438 WRITE DMA c8 03 01 00 00 00 e0 00 00:28:06.750 READ DMA ca 03 80 e7 0e 7b e1 00 00:28:06.750 WRITE DMA Error 3500 occurred at disk power-on lifetime: 11605 hours (483 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 80 e7 33 7b e1 Error: ICRC, ABRT at LBA = 0x017b33e7 = 24851431 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 03 80 e7 33 7b e1 00 00:28:06.625 WRITE DMA ca 03 80 67 33 7b e1 00 00:28:06.563 WRITE DMA ca 03 80 e7 32 7b e1 00 00:28:06.563 WRITE DMA ca 03 80 67 32 7b e1 00 00:28:06.563 WRITE DMA ca 03 80 e7 31 7b e1 00 00:28:06.563 WRITE DMA Error 3499 occurred at disk power-on lifetime: 11605 hours (483 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 80 67 c7 7a e1 Error: ICRC, ABRT at LBA = 0x017ac767 = 24823655 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 03 80 67 c7 7a e1 00 00:28:05.438 WRITE DMA ca 03 80 e7 c6 7a e1 00 00:28:05.438 WRITE DMA ca 03 80 67 c6 7a e1 00 00:28:05.438 WRITE DMA c8 03 01 00 00 00 e0 00 00:28:05.313 READ DMA ca 03 80 e7 c5 7a e1 00 00:28:05.250 WRITE DMA Error 3498 occurred at disk power-on lifetime: 11605 hours (483 days + 13 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 84 51 80 67 b8 7a e1 Error: ICRC, ABRT at LBA = 0x017ab867 = 24819815 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- ca 03 80 67 b8 7a e1 00 00:28:05.250 WRITE DMA ca 03 80 e7 b7 7a e1 00 00:28:05.250 WRITE DMA ca 03 80 67 b7 7a e1 00 00:28:05.250 WRITE DMA ca 03 80 e7 b6 7a e1 00 00:28:05.250 WRITE DMA ca 03 80 67 b6 7a e1 00 00:28:05.250 WRITE DMA SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective Self-Test Log Data Structure Revision Number (0) should be 1 SMART Selective self-test log data structure revision number 0 Warning: ATA Specification requires selective self-test log data structure revision number = 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. TU-160:~# |
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